Automating Scanning Tunneling Microscopy with AI/ML

POSTER

Abstract

                Scanning Tunneling Microscopy (STM) is a novel technique for obtaining atomic-resolution images of a sample surface and map the local density of states (LDOS). However, STM experiments tend to be time-consuming, difficult to reproduce, and require constant manual adjustment. To overcome these difficulties, we have developed machine-learning (ML)-assisted workflow that automates an experiment by controlling multiple instruments to correct for magnetic, piezoelectric, and thermal drift in real time. With this workflow, we were able to acquire the LDOS of superconductors as a function of temperature and magnetic field while compensating for drift in real time, which improves the reproducibility of data collected across multiple experiments. The STM automation significantly reduces the time and manpower for data acquisition, which will allow us to collect vast amount of data in reliable and systematic way.

*This research was primarily supported by the National Science Foundation Materials Research Science and Engineering Center program through the UT Knoxville Center for Advanced Materials and Manufacturing (DMR-2309083).

Presenters

  • Connor Vernachio

    • University of Tenessee, Knoxville

Authors

  • Connor Vernachio

    • University of Tenessee, Knoxville
  • Huanhuan Zhao

    • Bredesen Center for Interdisciplinary Research, University of Tennessee, Knoxville
  • Wooin Yang

    • University of Tennessee, Knoxville
    • University of Tennessee
  • Arpan Biswas

    • University of Tennessee
  • Wonhee Ko

    • University of Tennessee, Knoxville