A study on the effects of noise on ePIC tracking

The Electron-Ion Collider (EIC), currently under construction at the Brookhaven National Laboratory, is a particle collider designed to probe the internal structure of protons and nuclei with high precision. Its first major experiment, the Electron-Proton/Ion Collider (ePIC), is a detector optimized for tracking, calorimetry, and particle identification in a high luminosity environment. The Silicon Vertex Trackers (SVT) provide high-resolution measurements of charged-particle trajectories which consists of 4 inner barrel layers, 2 outer barrel layers, and 10 endcap disks. The EICrecon software was developed in order to take the data from the ePIC detector, whether real or simulated, and to reconstruct these data points into physical values, like hits and tracks. EICrecon provides an idealized simulation as it does not experience electronic noise. However, there will be noise in our detectors when physical experiments are conducted. The current version of EICrecon has the capability to inject noise into the SVT inner and outer barrels, and the endcap layers. This study examines the efficiency of tracks in the presence of noise, by taking the distribution of Monte Carlo particles with reconstructed tracks, and dividing by the total Monte Carlo particle distribution. We used hit-based matching to verify that these reconstructed tracks match arbitrarily well with the true hits. Noise is injected on a layer-by-layer basis to reflect geometric variations across subdetectors. Further analysis will explore noise effects under both single-muon and deep inelastic scattering (DIS) events across various momentum resolutions to see how the distribution of efficiency varies as a function of transverse momentum.