Impact of variability in parallel operation of single electron pumps

ORAL

Abstract

Single electron charge pumps (SEPs) generate currents of ~100 pA at a relative uncertainty of about 10-7. In these experiments, the pumped current is given by, I = nef, where is the number of pumps operated in parallel. A significant effort is underway to increase n so that currents in the range of 10 nA can be reached while maintaining low uncertainty. Limitations in parallel device operation arise from device-to-device variability in the position, and quality of the plateaus. These variations can result in non-overlapping current plateaus and an inability to parallelize. To overcome variations one can employ a post-selection strategy to only operate devices with sufficient uniformity or build the array to use compensating gate voltages to each device to bring them into alignment or a combination of these strategies. Using the decay cascade model, we study the effects of these variations in paralleled devices, to bound the requirements of device uniformity and assess the likelihood of success.

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Presenters

  • Pooja Yadav

    • NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
    • ASSOCIATE, NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY

Authors

  • Pooja Yadav

    • NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
    • ASSOCIATE, NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY

  • TIM WILSON

    • ASSOCIATE, National Institute of Standards and Technology, Physical Measurement Lab, Gaithersburg, MD USA

  • Tommy O. Boykin II

    • ASSOCIATE, National Institute of Standards and Technology (NIST)

  • Eite Tiesinga

    • National Institute of Standards and Technology (NIST)

  • Masaya Kataoka

    • National Physical Laboratory, Hampton Road, Teddington, Middlesex TW11 0LW, United Kingdom

  • Michael David Stewart

    • National Institute of Standards and Technology (NIST)