Autonomous Initialization and Calibration of Multi-Qubit Quantum-Dot Devices

Oral-In-person

Abstract

Autonomous control and calibration of semiconductor quantum-dot (QD) arrays are essential for scalable operation of spin-based quantum processors. The recently developed bootstrapping, autonomous testing, and initialization system (BATIS) demonstrated a physics-guided, platform-agnostic approach to device initialization and channel formation in undoped Si/SiGe QD devices at 1.3 K [1]. Building on this foundation, we present an extended implementation of BATIS applied to a multi-qubit QD device in planar germanium. This extension addresses the exponentially increasing complexity of gate-voltage space in large-array systems while maintaining robust performance in the presence of trapped charge and high-temperature noise environments.

Our results demonstrate that the flexible and scalable design of BATIS enables reliable autonomous initialization of multi-qubit QD arrays, supporting the development of automated multi-qubit full calibration systems.

Publication: [1] T. J. Kovach, D. Schug, M. A. Wolfe, E. R. MacQuarrie, P. J. Walsh, O. M. Eskandari, J. Benson, M. Friesen, M. A. Eriksson, and J. P. Zwolak, "Bootstrapping and autonomous tuning system for Si/SiGe multi-quantum dot devices," (2025). https://arxiv.org/abs/2412.07676

Presenters

  • Zach Merino

    • University of Maryland College Park

Authors

  • Zach Merino

    • University of Maryland College Park
  • Anton Zubchenko

  • Tyler Kovach

    • University of Wisconsin-Madison
  • Daniel Schug

    • University of Maryland College Park
  • Achilleas Bardakas

  • David van Driel

    • Delft University of Technology
  • Nico Hendrickx

  • Lucas Stehouwer

  • Giordano Scappucci

    • TU Delft QuTech
  • Mark Friesen

    • University of Wisconsin - Madison
  • Mark Eriksson

    • University of Wisconsin - Madison
  • Anasua Chatterjee

    • Delft University of Technology
  • Justyna Zwolak

    • National Institute of Standards and Technology (NIST)