Systematic errors in the calibration of cryogenic amplifier chains due to Fano interference 

ORAL

Abstract

Waveguide-QED transmon measurements are a powerful tool to calibrate microwave amplification chains inside a dilution refrigerator. Here we show how systematic errors of up to 2 dB on the extracted added noise arise from Fano interference of the signal with a background path. Limited knowledge of the interfering paths in a given setup translates into a range of uncertainty for the added noise calibration, which increases with the transmon-waveguide coupling strength. We experimentally illustrate the relevance of Fano interference in calibrating using a waveguide-QED transmon as a power sensor and quantify the errors encountered in extracting amplifier noise parameters. We also show how to characterize and utilize the Fano interference to eliminate these systematic errors.

Presenters

  • Xander R Ault

    • University of Colorado Boulder

Authors

  • Manuel A Castellanos-Beltran

    • National Institute of Standards and Technology Boulder
  • Xander R Ault

    • University of Colorado Boulder
  • Adam J Sirois

    • National Institute of Standards and Technology Boulder
  • David Olaya

    • National Institute of Standards and Technology
    • NIST/University of Colorado Boulder
  • Danilo Labranca

    • National Institute of Standards and Technology Boulder
  • Andrea Giachero

    • University of Milano-Bicocca
    • University of Milan, Bicocca
  • Samuel P Benz

    • National Institute of Standards and Technology Boulder
    • National Institute of Standards and Technology
  • Peter F Hopkins

    • National Institute of Standards and Technology Boulder