Error model for X and Z measurement loops in Majorana Tetrons

ORAL

Abstract

We present an error model for the measurement loops of a Majorana tetron device. Such a device can be formed by connecting two parallel topological superconductors by a trivial superconducting backbone and the parity of pairs of Majorana zero modes (MZMs) can be probed by forming interferometric loops using quantum dots. In agreement with recent experimental observations [1], our theoretical results indicate a biased error model with the error rate of X loop measurements limited by the overlap of MZMs in finite length wires, while Z loop measurements are limited by external quasiparticle poisoning.

[1] Microsoft Quantum, Distinct Lifetimes for X and Z Loop Measurements in a Majorana Tetron Device, Arxiv 2507.08795 (2025).

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Publication: Microsoft Quantum, Distinct Lifetimes for X and Z Loop Measurements in a Majorana Tetron Device, Arxiv 2507.08795 (2025).

Presenters

  • Samuel Boutin

    • Microsoft Corporation
    • Microsoft Quantum

Authors

  • Samuel Boutin

    • Microsoft Corporation
    • Microsoft Quantum

  • Torsten Karzig

    • Microsoft Quantum

  • Tareq El Dandachi

    • Microsoft Quantum

  • Christina P Knapp

    • Microsoft Corporation
    • Microsoft Quantum

  • Ryan V Mishmash

    • Microsoft Quantum

  • Bela Bauer

    • Microsoft Corporation
    • Microsoft Quantum

  • Roman M Lutchyn

    • Microsoft Corporation
    • Microsoft Quantum

  • Chetan Nayak

    • Microsoft Corporation
    • Microsoft Quantum