A Piezoresistive AFM Approach to Quantum Twisting Microscopy of Twisted TMDs

Oral-In-person

Abstract

The quantum twisting microscope (QTM) has emerged as a powerful tool in the field of 2D electronic materials. It has been used to demonstrate coherent transport between two layers of vdW materials, momentum-resolved band structure of moiré bilayers, and phonon-spectra of graphene. Here we report on our progress in developing a QTM based on a piezoresistive active AFM probe. I will discuss details in the mechanical design to maintain junction stability of the twisting layers, the electrical characteristics. Preliminary results in graphene-based, and transition metal dichalcogenide (TMD) based moiré structures will be reported.

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Presenters

  • Chih-Kang Shih

    • University of Texas at Austin

Authors

  • Fan Zhang

    • University of Texas at Austin

  • Yanxing Li

    • Princeton University

  • Yiyuan Luo

    • University of Texas at Austin

  • Fuxiang Chen

  • Tingyi Lin

  • Yizhou Hao

  • Fangzhou Xia

  • Chih-Kang Shih

    • University of Texas at Austin