Visualizing Moiré Patterns and Lattice Reconstruction in Helically Twisted Trilayer Graphene with Scanning Tunneling Microscopy

Recent studies have proposed devices consisting of multiple graphene layers with near magic-angle twists as a promising platform for experimentally realizing correlated topological states. In such systems, moiré superlattices originating from consecutive layers are expected to experience lattice relaxation that significantly modifies the electronic band structure of the device.

We present our progress in characterizing structural and electronic properties of a helically twisted trilayer graphene device using scanning probe microscopy, focusing on two twist angle dependent reconstruction regimes that provide insight into how lattice relaxation modifies electronic band structure.