Charge pumping in Si/SiGe devices to realize the Ampere

ORAL

Abstract

Single electron devices can be operated as a source of electrical current, I=ef, where e is the elementary charge and f is the operating frequency. Several experiments have shown that this current can be produced at metrological uncertainty auguring use as a realization of the Ampere. Pumping has been demonstrated in several different material systems, such as GaAs, Si-MOS, and superconducting devices. Advances in Si/SiGe heterostructures and devices for quantum information have enabled charge pumping in this system with anticipated advantages in yield, uniformity, operating temperature and low-field operation. Here, we demonstrate charge pumping in Si/SiGe and our work toward purpose-optimized devices. We acknowledge device support from Intel Corp.

Presenters

  • Michael David Stewart

    • National Institute of Standards and Technology (NIST)

Authors

  • Michael David Stewart

    • National Institute of Standards and Technology (NIST)
  • Pooja Yadav

    • NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
    • ASSOCIATE, NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
  • Merritt P Losert

    • University of Wisconsin-Madison
    • National Institute of Standards and Technology (NIST)
    • NIST
  • Justyna P Zwolak

    • National Institute of Standards and Technology (NIST)