Van der Pauw characterization of NbTiN thin films

ORAL

Abstract



Van der Pauw method relies on the usage of measurement of voltage and current at different places of uniform semiconductor sample. This method can be generalized for the case of superconducting samples close to critical temperatures, so the dominant electrical current component is due to quasiparticles flow that generates the dissipation. Van der Pauw characterization of NbTiN thin films is presented.

–

Publication: [1]. Yihui Geng, Mathematical analysis of Van der Pauw's method for measuring resistivity,
J. Phys.: Conf. Ser. 2321, 012027.
[2]. L.J.Van der Pauw, A Method of Measuring the Resistivity and Hall Coefficient on Lamellae of Arbitrary Shape. Philips Technical Review, 20, 220-224, 1958.
[3]. A.Shapovalov, D.Menesenko, E.Zhitlukhina, A.Parra, A.Aliev, V.Shamaev, M.Gregor, and T.Plecenik, Inhomogeneous Resistivity of Transparent Superconductor Films Revealed by the Van Der Pauw Technique, Metallofiz. Noveishie Tekhnol., 46, No. 6: 517—529 2024.

Presenters

  • Krzysztof D Pomorski

    • University of New Mexico

Authors

  • Krzysztof D Pomorski

    • University of New Mexico

  • Diwas Khadka

    • University of New Mexico

  • Marek Osinski

    • University of New Mexico