Novel Strain Induced Magnetization of La_1−xSr_x​MnO₃​ Thin Films

La_1−xSr_x​MnO₃​ (LSMO) remains a model system for studying the interplay between electronic, magnetic, and structural degrees of freedom in doped perovskite oxides. Its half-metallic nature and strong coupling among double exchange, Jahn–Teller distortions, and strain make it a benchmark material for applications and correlated electron phenomena. In this work, high-quality LSMO thin films were grown via RF magnetron sputtering on Si(100), R-cut, and C-cut sapphire substrates. X-ray photoelectron spectroscopy confirmed stoichiometric control, X-ray diffraction and reflectivity indicated highly crystalline rhombohedral LSMO with smooth interfaces, and atomic force microscopy exhibited distinctly smooth surfaces (RMS roughness ≈0.2 nm). Magnetic characterization using SQUID magnetometry revealed maximum ferromagnetic character between 30 K and 120 K, dependent on thickness and substrate, with ZFC–FC divergence suggestive of nanoscale phase separation. These results establish reliable growth and characterization protocols for LSMO thin films and provide evidence for strain and thickness tuned magnetic relaxation, thus supporting future advances in magnetic sensors, spintronics, spin-lattice coupling, transport, and electronic phase competition in correlated oxide heterostructures.