Exciton Dynamics in Stacked InP Nanowires

Three-Beam Degenerate Heterodyne Four-wave Mixing (HFWM) measurements characterize coherent and ultrafast processes present within selective area epitaxy (SAE) grown indium phosphide nanowires. Statistical analysis of an ensemble of nanowires, with a varied distribution of wire stacking thicknesses was used to explore clustering effects and characterize the coherence of the wires more broadly. This study elucidated a link between the stacking thickness and the polarization beating observed within the wires' signal. Separate ensembles of nanowires generated from different growths, with differing growth parameters and properties, are subsequently used to corroborate this effect. An extension of the optical Bloch equations was then used to characterize the beating illuminating governing dynamics within stacked wire ensembles.