Accelerating cryogenic characterization of superconducting quantum devices with a fast turnaround cryostat

The rapid growth of quantum technologies demands fast and reliable characterization methods for materials and devices at sub-Kelvin temperatures. However, development cycles are slowed by long turnaround times of conventional cryostats, and the lack of integrated measurement capabilities. We present a fast-turnaround cryostat developed for the characterization of quantum devices, based on continuous magnetic cooling. A sample loader mechanism enables automatic cooling of quantum devices from room temperature to below 50 mK in less than four hours, and warm up in 30 minutes. The cryostat can be equipped with ready-to-use measurement options, eliminating the need for custom experimental setups. As an example, we showcase the measurement of a superconducting thin film using our resistance measurement option, demonstrating outstanding temperature resolution and accuracy. Additionally, we study the temperature dependence of the internal quality factor of a superconducting resonator in a completely automated way, enabling easy access to TLS related losses. Our results underline how rapid, accessible characterization at millikelvin temperatures helps overcome the growing bottleneck in quantum materials and device development.