Validation of Helicity-Resolved Raman Spectroscopy Using Chiral α-Quartz Phonons
ORAL
Abstract
For comparison of data from laboratories around the world, we must garner consensus on terminology and measurands relevant to chiral phonon measurements[1], especially for low dimensional or 2D materials. Even with linear polarization, errors or artifacts can be seen in published Raman data. Using universally available test materials, methodologies [2] and instrumental parameters have been developed to decrease such issues and enable reproducible results. Underway now is such an effort for helicity-resolved Raman spectra, including the impact of temperature and excitation wavelength. Our unique magneto-Raman measurement capabilities afford diffraction-limited, spatially-resolved Raman measurements while simultaneously varying the polarization (both incident and scattered), temperature (1.6 K to 400 K), laser wavelength (tunability from visible to near-infrared), and magnetic field (up to 9 T). Additionally, coupling to a triple grating spectrometer provides access to both low-frequency (down to 6 cm-1, or 0.75 meV) phonon and magnon modes and to the spectral resolution necessary for chiral measurements. By using broadband quarterwave plate (QWP), halfwave plate (HWP) and two polarizers we can confidently obtain in- or out-phase circularly polarized Raman measurements allowing us to probe all four combinations: RL,RL, RR and LL, where R and L refers to the handiness right of left respectively for the incident or Raman scatter. These four data sets are collected to define a circular intensity difference (CID) which goes beyond intensity to observe shifts and permits differentiating the impact of selection rules verses chirality on the test material of α-Quartz as a function of temperature and wavelength of excitation. Such measurement infrastructure provides confidence to measure unique phonon behavior such as chirality Zeeman splitting [3].
[1] Nature Phys. 2025, 21 1532
[2]arxiv.org/abs/2505.16063
[3] PRB 2025 111, 104419
[1] Nature Phys. 2025, 21 1532
[2]arxiv.org/abs/2505.16063
[3] PRB 2025 111, 104419
*M.F.M. and R.T. would like to acknowledge the NIST/National Research Council Postdoctoral Research Associateship Program for funding. This work was performed with funding from the CHIPS Metrology Program, part of CHIPS for America, National Institute of Standards and Technology, U.S. Department of Commerce.
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Presenters
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Angela R. Hight Walker
- National Institute of Standards and Technology (NIST)