Characterizing 2D Materials Using Advanced Electron Microscopy

In this presentation, I will discuss our recent advances in the characterization of a range of two-dimensional (2D) materials using state-of-the-art electron microscopy techniques. Our approach combines atomic-resolution imaging, quantitative diffuse scattering analysis, electron energy-loss spectroscopy (EELS), in situ microscopy, and time-resolved pump–probe ultrafast microscopy to probe both structural and dynamic phenomena. Case studies include low-temperature in situ electric biasing and magnetic field experiments that reveal topological spin–chiral texture transitions from chiral stripes to skyrmions; femtosecond laser–induced creation of sub-100 nm skyrmions; and electric-field control of skyrmion chirality. In addition, ultrafast photoexcitation experiments uncover the rapid formation of topological defects in a charge-density-wave system, offering new insight into charge–lattice coupling dynamics. Together, these studies demonstrate the power of advanced electron microscopy for elucidating complex interactions and emergent phenomena in 2D quantum materials.