Fabrication and Characterization of Monolayer Graphene Nanostructures

ORAL

Abstract

Graphene nanostructures offer a unique platform for exploring novel quantum phenomena arising from confined charged carriers. In order to study these phenomena, precise geometry and high-quality edges are required. Common lithographic techniques such as Reactive Ion Etching (RIE) can be used to mechanically define device geometry at the cost of unwanted etching byproducts. Furthermore, the lack of a bandgap in monolayer graphene has limited the use of electrostatically defined geometries to the high magnetic field regime. Here we will discuss fabrication of mechanically defined graphene constrictions using AFM based nanolithography and improvements in techniques used to incorporate the nano-structures into vdW heterostructures. We also present transport measurements of these constrictions at both zero and high magnetic fields, extending into the quantum Hall regime.

Presenters

  • Robert William Rienstra

    • George Mason University

Authors

  • Robert William Rienstra

    • George Mason University
  • Nishat Sultana

    • George Mason University
  • Joseph Wiechelman

    • George Mason University
  • Alec L Riso

    • Cornell University
  • Kenji Watanabe

    • National Institute for Materials Science
    • Research Center for Functional Materials, National Institute of Materials Science, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan
  • Takashi Taniguchi

    • National Institute for Materials Science
    • Research Center for Materials Nanoarchitectonics, National Institute for Materials Science
    • International Center for Materials Nanoarchitectonics, National Institute of Materials Science, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan
    • Research Center for Functional Materials, National Institute of Materials Science, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan
  • Curt A Richter

    • National Institute of Standards and Technology (NIST)
  • Joseph A Stroscio

    • National Institute of Standards and Technology (NIST)
    • National Institute of Standards and Technology
  • Fereshte Ghahari

    • George Mason University