Low Level Measurements using the Van der Pauw Technique

As part of the MANDE NSF REU program[1], this project aimed at developing a system to be used for determining electrical resistance in a bulk material or thin film. While a standard two probe technique is sufficient for some low-resistivity samples, the four probe Van der Pauw method is preferred for the materials we wish to study. An automated data acquisition system with geometric corrections was designed utilizing a suite of meters and sources and utilizing LabVIEW$^{TM}$ programming software and GPIB interfacing techniques.