Investigation of Eu doped TiO$_{2}$ thin films

ORAL

Abstract

We present second harmonic generation from Eu doped Titanium oxide (Ti O$_{2})$ thin films deposited on different substrates (glass, Si, LaAlO$_{3}$, MgO)by sputtering in different conditions. Atomic Force Microscope (AFM) was used to measure the grain size and the boundaries of the samples. Transmission Electron Microscope (TEM) was applied to study the morphology, crystal structure and for interface imaging. Spectroscopic characterization and comparison between different deposition conditions and substrates also will be presented.

*This research was supported by the National Science Foundation Grant No. DMR-0934218.

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Authors

  • Edward Khachatryan

    • The University of Texas at San Antonio
    • University of Texas at San Antonio

  • Erik Enriquez

    • University of Texas at San Antonio

  • Francisco Pedraza

    • University of Texas at San Antonio

  • Chonglin Chen

    • University of Texas at San Antonio

  • Dhiraj Sardar

    • University of Texas at San Antonio
    • UTSA