Study of Surface Plasmon Polariton propagation in Plasmonic Waveguides

POSTER

Abstract

Using surface plasmon polariton (SPP) tomography techniques, we study the propagation of SPPs in dielectric-loaded plasmonic waveguides. Surface emission and Fourier plane tomography images were used to characterize SPP propagation and losses in straight and curved, single and multimode waveguides. This study shows the imaging and characterization capabilities of SPP tomography.

Authors

  • Willis Agutu

    Texas Tech University

  • Charles Regan

    Department of Electrical and Computer Engineering and Nano Tech Center, Texas Tech University, LubbockTX 79409, USA, Texas Tech University, NanoTech Center and Department of Electrical Engineering, Texas Tech University, Nano Tech Center, Texas Tech University

  • Ayrton Bernussi

    Department of Electrical and Computer Engineering and Nano Tech Center, Texas Tech University, Lubbock, TX 79409, Texas Tech University, Department of Electrical and Computer Engineering and Nano Tech Center, Texas Tech University, LubbockTX 79409, USA, Texas Tech University, NanoTech Center and Department of Electrical Engineering, Nano Tech Center, Texas Tech University

  • Luis Grave de Peralta

    APS, Texas Tech University, Department of Physics and Nano Tech Center, Texas Tech University, Lubbock, TX 79409, USA, Applied Physical Society, Texas Tech University, NanoTech Center and Department of Physics, Nano Tech Center, Texas Tech University