TERS and AFM Mapping of Molecular Aggregates

ORAL

Abstract

Tip-enhanced Raman spectroscopy is a well-known analysis technique for surfaces and other material science. We combined TERS mapping with a simultaneous AFM mapping in order to correlate topographical features with corresponding Raman spectra. We applied this technique to image copper phthalocyanine molecular aggregates on a molybdenum disulfide substrate. Our results showed chemically-enhanced Raman ``hot spots'' on the sample surface. These did not correspond with the Raman hot spots observed without the tip. This is the first imaging of chemically-enhanced Raman hot spots on a semiconductor surface.

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Authors

  • Zachary Liege

    • Baylor University, Texas A\&M University
    • None

  • Alexander Sinyukov

    • Texas A\&M University

  • Dmitri Voronine

    • Texas A\&M University, Baylor University

  • Alexei Sokolov

    • Texas A\&M University, Baylor University