Subwavelength resolution using scanning diffracted-light microscopy and plasmonic ultra-thin condensers
POSTER
Abstract
Fourier Ptychographic Microscopy techniques are phase-recovery imaging algorithms capable of producing high-resolution images of objects smaller than Rayleigh resolution limit. Traditionally, these algorithms require long exposure times, multiple iterations, and suffer from low image diversity. We developed a new technique called Illumination Direction Multiplexing-Scanning Diffracted-Light Microscopy (IDM-SDLM) that uses a plasmonic Ultra-thin condenser (UTC), and a rotating slit placed at the back focal plane to overcome these issues. We demonstrated enhanced imaging capabilities of plasmonic crystals with periods (p) in the range λ/(NAo + NAc) < p < λ/(2NAo), using plasmonic UTCs with NAc > NAo, which set the precedent for a novel kind of optical nanoscope.
Presenters
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Sueli Skinner Ramos
Texas Tech University, Department of Physics and Astronomy
Authors
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Sueli Skinner Ramos
Texas Tech University, Department of Physics and Astronomy
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Hira Farooq
Texas Tech University, Department of Physics and Astronomy
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Hawra Alghasham
Texas Tech University, Department of Physics and Astronomy
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Ayrton A. Bernussi
Texas Tech University, Department of Electrical and Computer Engineering
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Luis Grave de Peralta
Texas Tech University, Department of Physics and Astronomy