Subwavelength resolution using scanning diffracted-light microscopy and plasmonic ultra-thin condensers

POSTER

Abstract

Fourier Ptychographic Microscopy techniques are phase-recovery imaging algorithms capable of producing high-resolution images of objects smaller than Rayleigh resolution limit. Traditionally, these algorithms require long exposure times, multiple iterations, and suffer from low image diversity. We developed a new technique called Illumination Direction Multiplexing-Scanning Diffracted-Light Microscopy (IDM-SDLM) that uses a plasmonic Ultra-thin condenser (UTC), and a rotating slit placed at the back focal plane to overcome these issues. We demonstrated enhanced imaging capabilities of plasmonic crystals with periods (p) in the range λ/(NAo + NAc) < p < λ/(2NAo), using plasmonic UTCs with NAc > NAo, which set the precedent for a novel kind of optical nanoscope.

Presenters

  • Sueli Skinner Ramos

    Texas Tech University, Department of Physics and Astronomy

Authors

  • Sueli Skinner Ramos

    Texas Tech University, Department of Physics and Astronomy

  • Hira Farooq

    Texas Tech University, Department of Physics and Astronomy

  • Hawra Alghasham

    Texas Tech University, Department of Physics and Astronomy

  • Ayrton A. Bernussi

    Texas Tech University, Department of Electrical and Computer Engineering

  • Luis Grave de Peralta

    Texas Tech University, Department of Physics and Astronomy