Fourier ptychographic microscopy using a computer-controlled hemispherical digital condenser
POSTER
Abstract
A computer-controlled hemispherical digital condenser is used in combination with an optical microscope for implementing Fourier plane imaging (FPIM) and Fourier ptychographic (FPM) microscopy techniques. Notable improvement in image resolution was obtained. We discuss some limitations of FPM, the relationship between FPM and FPIM, and the advantages and disadvantages of these two optical microscopy techniques.
Authors
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Meznh Alsubaie
Texas Tech Univ, APS
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Sanchari Sen
Texas Tech Univ
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Darshan Desai
Texas Tech Univ
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Ayrton Bernussi
Texas Tech Univ
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Luis Grave de Peralta
Texas Tech Univ, APS