Fourier ptychographic microscopy using a computer-controlled hemispherical digital condenser

POSTER

Abstract

A computer-controlled hemispherical digital condenser is used in combination with an optical microscope for implementing Fourier plane imaging (FPIM) and Fourier ptychographic (FPM) microscopy techniques. Notable improvement in image resolution was obtained. We discuss some limitations of FPM, the relationship between FPM and FPIM, and the advantages and disadvantages of these two optical microscopy techniques.

Authors

  • Meznh Alsubaie

    Texas Tech Univ, APS

  • Sanchari Sen

    Texas Tech Univ

  • Darshan Desai

    Texas Tech Univ

  • Ayrton Bernussi

    Texas Tech Univ

  • Luis Grave de Peralta

    Texas Tech Univ, APS