Femtosecond snapshots of nano crystalline response to XFEL pulse trains
POSTER
Abstract
The European XFEL enables sequential single-shot diffraction snapshots at megahertz repetition rates. These rapid-fire pulses have been successfully applied for serial femtosecond crystallography [1,2] where a fast flowing target delivers a new sample between shots. However, the use of high-repetition-rate pulses for an individual fixed-in-place target depends critically on understanding the response of the target-- damage to which limits the usable fluence per image. We have investigated the response of a CdSe nanocrystalline target using a novel pulse-on-demand method where sequential single-shot diffraction images were acquired for a variable number of x-ray pulses over a wide range of fluence. Unusual features appear in the diffraction pattern and morphology that can be used to model the target response. [1] M. L. GrŸnbein\textit{ et al}., Nat. Commun.\textbf{ 9}, 3487 (2018 [2] M. O. Wiedhorn\textit{ et al}., Nat. Commun. 9, 4025 (2018)
Authors
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Yoshiaki Kumagai
Tokyo University of Agriculture and Technology, Argonne National Laboratory
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Gilles Doumy
Argonne National Laboratory
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Anthony DiChiara
Argonne National Laboratory
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Tijana Rajh
Argonne National Laboratory
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Elena Shevchenko
Argonne National Laboratory
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Haidan Wen
Argonne National Laboratory
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Linda Young
Argonne National Laboratory
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Andre Al Haddad
Paul Scherrer Institut
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Christoph Bostedt
Paul Scherrer Institute, Paul Scherrer Institut, Argonne National Lab
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Andreas Galler
European XFEL
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Jan Offermann
The University of Chicago