In-situ measurement method of sheath capacitance in plasmas

POSTER

Abstract

In-situ measurement method of sheath capacitance was studied. To measure the sheath capacitance, small dual frequency sinusoidal voltage signals ($\sim$1V) are applied to floating planar probe. The sheath circuit model and capacitance of the dielectric deposition film on the probe are considered in our measurement. The experiment was performed at various discharge conditions and our results are in good agreements with other studies. This study can be helpful for plasma monitoring in industrial processing.

Authors

  • Jin-Yong Kim

    Hanyang Univ.

  • Chin-Wook Chung

    Hanyang University, Department of Electrical Engineering, Hanyang University, Hanyang Univ., Department of Electrical Engineering, Hanyang University, Seoul, 133-791, Republic of Korea, Department of Electrical Engineering, Hanyang University, Seoul 133-791, South Korea