Focus Session: Advances in Scanned Probe Microscopy I: Novel AFM, MRFM, and Acoustic Microscopy

Presentations

• Probing bias-strain coupling on the nanoscale by Piezoresponse Force Microscopy: from ferroelectric and multiferroics to energy storage materials

  COFFEE_KLATCH · Invited

  March 15, 2010, 11:15 AM – March 15, 2010, 11:51 AM

  Authors

  • Sergei Kalinin

    • Oak Ridge National Laboratory
    • Oak Ridge National Laboratory, Oak Ridge, TN 37831
    • ORNL, Oak Ridge, TN

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• Towards ultrasensitive scanning probe force detection with silicon nanowire mechanical resonators

  ORAL

  March 15, 2010, 11:51 AM – March 15, 2010, 12:03 PM

  Authors

  • John Nichol

    • University of Illinois at Urbana-Champaign

  • Eric Hemesath

    • Northwestern University

  • Lincoln Lauhon

    • Northwestern University

  • Raffi Budakian

    • University of Illinois at Urbana Champaign
    • University of Illinois
    • Department of Physics, University of Illinois at Urbana-Champaign
    • University of Illinois at Urbana-Champaign

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• Characterization of an MRFM probe in the SPAM geometry

  ORAL

  March 15, 2010, 12:03 PM – March 15, 2010, 12:15 PM

  Authors

  • Doran Smith

    • US Army Research Laboratory

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• High sensitivity electron spin magnetic resonance force microscopy for labeled biological samples

  ORAL

  March 15, 2010, 12:15 PM – March 15, 2010, 12:27 PM

  Authors

  • Eric W. Moore

    • Department of Chemistry and Chemical Biology, Cornell University

  • SangGap Lee

    • Cornell University
    • Department of Chemistry and Chemical Biology, Cornell University

  • Steven A. Hickman

    • Department of Chemistry and Chemical Biology, Cornell University

  • Sarah J. Wright

    • wrightsarahjane@gmail.com

  • Lee E. Harrell

    • Department of Physics, U.S. Military Academy

  • Jonilyn G. Longenecker

    • Department of Chemistry and Chemical Biology, Cornell University

  • Peter P. Borbat

    • Department of Chemistry and Chemical Biology, Cornell University

  • Jack H. Freed

    • Department of Chemistry and Chemical Biology, Cornell University

  • John A. Marohn

    • Cornell University
    • Department of Chemistry and Chemical Biology, Cornell University

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• Non-degenerate parametric amplification used for surface noise evasion in scanned probe microscopy

  ORAL

  March 15, 2010, 12:27 PM – March 15, 2010, 12:39 PM

  Authors

  • SangGap Lee

    • Cornell University
    • Department of Chemistry and Chemical Biology, Cornell University

  • Eric Moore

    • Cornell University

  • Steven Hickman

    • Cornell University

  • Lee Harrell

    • U.S. Military Academy

  • John A. Marohn

    • Cornell University
    • Department of Chemistry and Chemical Biology, Cornell University

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• Whispering-Gallery Acoustic-Sensing of Shear-forces

  ORAL

  March 15, 2010, 12:39 PM – March 15, 2010, 12:51 PM

  Authors

  • Rodolfo Fernandez Rodriguez

    • Dr. La Rosa's group, Department of Physics, Portland State University

  • Xiaohua Wang

    • Dr. La Rosa's group, Department of Physics, Portland State University

  • Mike Hopkins

    • Dr. La Rosa's group, Department of Physics, Portland State University

  • Keith Parker

    • Dr. La Rosa's group, Department of Physics, Portland State University

  • Richard Nordstrom

    • Department of Mechanical and Materials Engineering, Portland State University

  • Andres La Rosa

    • Dr. La Rosa's group, Department of Physics, Portland State University
    • Portland State University

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• The Ultrasonic-Coupled Near-Field Microscope

  ORAL

  March 15, 2010, 12:51 PM – March 15, 2010, 1:03 PM

  Authors

  • Andres La Rosa

    • Dr. La Rosa's group, Department of Physics, Portland State University
    • Portland State University

  • Rodolfo Fernandez

    • Portland State University

  • Xiohua Wang

    • Portland State University

  • Michael Hopkins

    • Portland State University

  • Keith Parker

    • Portland State University

  • Richard Nordstrom

    • Portland State University

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• AFM Study of Charge Transfer Between Metals Due to the Oxygen Redox Couple in Water

  ORAL

  March 15, 2010, 1:03 PM – March 15, 2010, 1:15 PM

  Authors

  • Jeremy Trombley

    • Case Western Reserve University

  • Tessie Panthani

    • Case Western Reserve University

  • R. Mohan Sankaran

    • Case Western Reserve University

  • John Angus

    • Case Western Reserve University

  • Kathleen Kash

    • Case Western Reserve University

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• Towards Obtaining Ultimate Resolution with Atomic Force Microscopy

  ORAL

  March 15, 2010, 1:15 PM – March 15, 2010, 1:27 PM

  Authors

  • Nikolaj Moll

    • IBM Research - Zurich, 8803 Rueschlikon, Switzerland
    • IBM Research - Zurich

  • Leo Gross

    • IBM Research - Zurich, 8803 Rueschlikon, Switzerland
    • IBM Research - Zurich

  • Fabian Mohn

    • IBM Research - Zurich, 8803 Rueschlikon, Switzerland
    • IBM Research - Zurich

  • Alessandro Curioni

    • IBM Research - Zurich

  • Gerhard Meyer

    • IBM Research - Zurich, 8803 Rueschlikon, Switzerland
    • IBM Research - Zurich

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• Spatial Resolution of Electrical Measurements Performed with Scanning Probe Microscopes as a Function of Tip Shape

  ORAL

  March 15, 2010, 1:27 PM – March 15, 2010, 1:39 PM

  Authors

  • Ilona Sitnitsky

    • College of Nanoscale Science and Engineering, State University of New York

  • Vincent LaBella

    • College of Nanoscale Science and Engineering, State University of New York

  • Joseph Kopanski

    • National Institute of Standards and Technology

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• Micromolding fabrication of SiC SPM probes

  ORAL

  March 15, 2010, 1:39 PM – March 15, 2010, 1:51 PM

  Authors

  • Chiayun Wu

    • University of Massachusetts Lowell Dept. of Physics

  • Lian Dai

    • University of Massachusetts Lowell Dept of Electrical and Computer Engineering

  • Carlos Hernandez

    • University of Massachusetts Lowell Dept of Electrical and Computer Engineering

  • Daniel Schmidt

    • University of Massachusetts Lowell Dept of Plastics Engineering

  • Joel Therrien

    • University of Massachusetts Lowell
    • Dept. of Electrical \& Computer Engineering, Univ. of Mass Lowell
    • U. Massachusetts Lowell
    • University of Massachusetts Lowell Dept of Electrical and Computer Engineering

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• Atomic-scale Nanoprobes Fabricated by Localized Ion Flux Reduction and Field-Directed Sputter Sharpening

  ORAL

  March 15, 2010, 1:51 PM – March 15, 2010, 2:03 PM

  Authors

  • Scott Schmucker

    • University of Illinois at Urbana-Champaign

  • Joseph Lyding

    • University of Illinois at Urbana-Champaign

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• Elastic property characterization of oxidized Si nanowires by contact-resonance atomic force microscopy

  ORAL

  March 15, 2010, 2:03 PM – March 15, 2010, 2:15 PM

  Authors

  • Gheorghe Stan

    • National Institute of Standards and Technology

  • Robert Cook

    • National Institute of Standards and Technology

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