Charge Localization Near Acceptors in Transition-Metal Oxides

ORAL

Abstract

Controlling the conductivity in transition-metal (TM) oxides is a great challenge to make them usable in electronic and optoelectronic devices. P-type doping, in particular, is hindered by the high ionization potential of these materials; their valence bands (VB) are derived from O 2p orbitals, lying very low in energy with respect to the vacuum. Adding holes to the VB, either by introducing acceptors or by photon excitation, invariably leads to the localization of the carriers, in the form of small polarons, precluding p-type conductivity. In this presentation, we use density functional theory with the HSE06 hybrid functional to explore the impact of acceptor impurities on the electronic and optical properties of TM oxides, such as TiO2 and SrTiO3, paying attention to charge localization, i.e., the interaction between the acceptors and small hole polarons. We first discuss hole localization in the absence of any impurity, and then analyze the formation of small polarons and their stability near acceptor impurities through the calculation of binding energies. We address the effects of size and chemical differences between the acceptors and the host atoms on binding energies and ionization energies. Finally, we discuss possible cases where p-type conductivity could be observed.

Presenters

  • Fernando Sabino

    Department of Material science and Engineering, university of delaware, Department of Materials Science and Engineering, University of Delaware

Authors

  • Fernando Sabino

    Department of Material science and Engineering, university of delaware, Department of Materials Science and Engineering, University of Delaware

  • Anderson Janotti

    Univ of Delaware, Department of Materials Science and Engineering, Univ of Delaware, University of Delaware, Departament of Materials Science and Engineering, University of Delaware, Department of Material science and Engineering, university of delaware, Department of Materials Science and Engineering, University of Delaware, Department of Materials Science & Engineering, University of Delaware