Fabrication of Single Donor and Single Electron Transistors for Quantum Technologies
ORAL
Abstract
We have developed robust lithography, device relocation, and contact processes that enable routine electrical measurement of atomically precise devices with an emphasis on minimizing process-induced dopant movement. Our low temperature palladium silicide contact process provides low-resistance ohmic contacts with yield better than 98%.
This presentation will cover fabrication and characterization of STM patterned nanometer scale wire devices to investigate low dimensional transport. We will present the design and characterization of multiple single electron transistors that demonstrate stable coulomb blockade oscillations. We will demonstrate controlled variation in electronic and quantum properties as a function of atomic scale changes in device geometry. This will include spectroscopic measurements of atomically precise, single atom devices.
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Presenters
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Rick Silver
Nanoscale Device Characterization Division, National Institute of Standards and Technology, National Institute of Standards and Technology
Authors
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Rick Silver
Nanoscale Device Characterization Division, National Institute of Standards and Technology, National Institute of Standards and Technology
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Ranjit Kashid
National Institute of Standards and Technology
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Xiqiao Wang
National Institute of Standards and Technology
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Jonathan Wyrick
National Institute of Standards and Technology, Atom Scale Device Group, Nanoscale Device Characterization Division, National Institute of Standards and Technology
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Pradeep Namboodiri
National Institute of Standards and Technology, Atom Scale Device Group, Nanoscale Device Characterization Division, National Institute of Standards and Technology
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Scott W Schmucker
National Institute of Standards and Technology
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Andrew J Murphy
National Institute of Standards and Technology
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Michael David Stewart
National Institute of Standards and Technology
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Neil Zimmerman
National Institute of Standards and Technology