Superconducting through-silicon vias as capacitive elements in quantum circuits
ORAL · Invited
Abstract
[1] T. M. Hazard et al., Appl. Phys. Lett. 123, 154004 (2023).
[2] T. M. Hazard et al., Phys. Rev. Appl. 20, 034056 (2023).
* This material is based upon work supported in part by the U.S. Department of Energy, Office of Science, Office of Advanced Scientific Computing Research, High Performance Computing and Network Facilities (Rep - Quantum Testbeds), under contract number: FWP #FP00008338; in part by the Undersecretary of Defense for Research & Engineering under Air Force Contract No. FA8721-05-C-0002; and in part by the LPS Qubit Collaboratory. The views and conclusions contained herein are those of the authors and should not be interpreted as necessarily representing the official policies or endorsements, either expressed or implied, of the U.S. Government.
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Publication: Appl. Phys. Lett. 123, 154004 (2023) and Phys. Rev. Appl. 20, 034056 (2023).
Presenters
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Thomas M Hazard
Lincoln Laboratory, Massachusetts Institute of Technology, MIT Lincoln Lab, MIT Lincoln Laboratory
Authors
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Thomas M Hazard
Lincoln Laboratory, Massachusetts Institute of Technology, MIT Lincoln Lab, MIT Lincoln Laboratory