Cryogenic Screening of Si/SiGe Quantum Devices at 700 mK

Si/SiGe spin qubits are a promising platform for quantum computing due to their compatibility with industrial fabrication techniques. As millions of physical qubits will be required to implement a useful quantum algorithm, the ability to rapidly screen increasingly complex devices is becoming more important. In this talk, we outline device screening protocols that are implemented in a fast-turnaround 700 mK cryostat. We highlight the extraction of important device metrics, such as charging and orbital energies, and illustrate common device failure mechanisms. Extensions of this work include automating the procedure for forming quantum dots [1] and probing multiple devices during a single cool down using a cryogenic multiplexer [2].

[1] Zubchenko et al., Phys. Rev. Appl. 23, 14072 (2025)

[2] Paquelet Wuetz et al., npj Quantum Info. 6, 43 (2020)