Quantized Transport of Disordered Superconducting Fractional Quantum Hall Edge (I): the ν=2/3 Case Study

ORAL

Abstract

Quantum Hall edge states in proximity to a superconductor (SC) usually acquire a non-quantized electron-to-hole conversion probability in transport, due to non-universal SC couplings and disorders. With counter-propagating modes, we show that the situation can be the opposite in the filling ν=2/3 fractional quantum Hall (FQH) edge states with SC proximity, where disordered SC-couplings can reconstruct the edge states into an infinite set of stable phases with quantized electron-to-hole conversion probability along a long edge. Each phase is dominated by a disordered SC-coupling that tunnels ±|qN| Cooper pairs, which can take values |qN|=1,4,15, etc. We predict that this gives rise to a quantized downstream resistance Rd=h/[2(qNe)2] in an FQH-SC junction, serving as a quantized electrical transport signature beyond the Hall conductance. Higher-order nonlinear transport due to irrelevant Cooper pair tunneling or vortex dissipation is further studied, which becomes dominant when the edge is in a normal phase. Our results apply to both the single-layer state (as a particle-hole conjugate of ν=1/3) and the bilayer Halperin-(112) state, revealing a rich landscape of disorder-stabilized phases in FQH edge states with SC proximity, and may as well apply to fractional Chern insulators recently observed at the same filling.

*This work is supported by the National Science Foundation under award DMR-2141966, and the National Science Foundation through Princeton University's Materials Research Science and Engineering Center DMR2011750. Additional support is provided by the Gordon and Betty Moore Foundation through Grant GBMF8685 towards the Princeton theory program. P.M.T. is supported by a postdoctoral research fellowship at the Princeton Center for Theoretical Science and a Croucher Fellowship. H.C. receives additional supports from Bede Liu Fund for Excellence at the Department of Electrical and Computer Engineering of Princeton University.

Publication: arXiv:2505.20398

Presenters

  • Pok Man Tam

    • Princeton University

Authors

  • Pok Man Tam

    • Princeton University
  • Hao Chen

    • Princeton University
  • Biao Lian

    • Princeton University